![]() However, these are often a long way from being “live and real-time” operation rather, they demonstrate that “over the shoulder” or “remote desktop” viewing is possible, but “live interactive control” of the microscope is much more challenging. There have been many “demonstrations” at microscopy conferences of data collection on a vendor’s exhibition booth from a microscope that is hundreds or even thousands of miles away. The idea of remote operation of electron microscopes is not new. The expertise of this cohort spans all aspects of electron and ion beam instrumentation making CEMAS a “one-stop shop” that attracts users from OSU, as well as from universities, government laboratories, and industries across the globe. The physical infrastructure is further supported by an impressive intellectual foundation of nineteen permanent staff, including eight faculty members, nine research officers, two administrative officers, and two resident ThermoFisherScientific (FEI Company) specialists-a research applications engineer and a product marketing engineer. The innovative building design and quality infrastructure ensure that every instrument in the facility meets or exceeds manufacturer performance specifications ( Figure 1). The Center for Electron Microscopy and Analysis (CEMAS) at The Ohio State University (OSU) is designed to provide the ideal environment for electron microscopy-designed by microscopists for microscopy (). The Center for Electron Microscopy and Analysis at OSU The creation of a digital lecture theater that provides this capability at every seat results in an electron microscopy collaboratory that revolutionizes teaching, learning, and research in electron microscopy and characterization. This enables researchers in different locations to work together, sharing observations in real time, and enables trainees to gain the hands-on experience they require to become proficient in the use of these sophisticated techniques. ![]() By duplicating the control interface and connecting to the microscope through a high-speed network, users outside of the microscope control room can operate the instrument as if they were sitting in front of it. Coupling these powerful instruments with high-speed digital communications promises to revolutionize the way scientists collaborate with each other and train the next generation of researchers. Scanning electron microscopes (SEMs) and dual-beam focused-ion-beam (FIB) instruments are multi-technique platforms that are being used for research ranging from in situ studies of mechanical properties to 3D reconstruction of biomaterials. Their capabilities are enabling groundbreaking discoveries in fields ranging from materials science to medicine. Advanced (scanning) transmission electron microscopes, (S)TEMs, can resolve individual atoms and measure atomic displacements with near picometer precision. ![]()
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